Measurement of the x-ray flourescence parameters for Ag-Cu thi̇n fi̇lm alloys wi̇th the EDXRF method
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Abstract (EN)
In this study, K shell X-ray production cross-sections and fluorescence yields of Ag and Cu elements were investigated for the Ag-Cu thin film alloys using the ED-XRF technique. The samples were excited by 59.5 keV γ-rays emitted from 241Am radioisotope source and K X-rays emitted from samples were counted by means of Ultra-LEGe detector with a resolution 150 eV at 5.9 keV. The obtained values from this study have been compared with theoretical values. It was observed that differences between the XRF parameters are not depend on the concentrations of the elements in the alloys.
Author
Kazım Karabulut
How to Cite
Kazım Karabulut (Master Thesis). Measurement of the x-ray flourescence parameters for Ag-Cu thi̇n fi̇lm alloys wi̇th the EDXRF method, 2015, Karadeniz Technical University.
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