Investigation of dielectric properties of polyethylene oxide thin films

In this study, polyethylene oxide (PEO) thin films having three different molecular weights were obtained by thermal evaporation method. Sample thicknesses were determined as 20, 100, 250 and 500 nm for each molecular weight. Capacity (C) and loss factor (tanδ) measurements of the samples were carried out by dielectric spectroscopy at room temperature and frequency range of 1 Hz - 20 MHz. Dielectric constant, dielectric loss and alternative conductivity values were calculated by using the obtained results. Thickness, frequency and molecular weight behavior of dielectric properties of these samples were investigated and possible polarization mechanisms in the structure were determined.