Analysis of patent/utility model applications targeted on X-ray imaging in the field of nuclear physics

In recent years, the patent studies have become more important in our contry and worldwide. It has been thought that the number of patent applications in a field is related to the level of development of the country in that field. In this study, a classification of patent/utility model applications which are aimed to X-ray imaging in the nuclear field will be made according to their selected bibliographic features and comparative analysis will be given in the light of these classifications. As a result, these analysis will be associated with the level of development of the countries in this field. This research will cover patent/utility model applications received from the database of WIPO, EPO and the TPMK. A special data set will be generated by classifying the patent/utility model applications filed in the last 10 years on the subject of X-ray imaging in the nuclear field, according to the features of those, such as application date, applicant, filing country, filing subject, etc. The results of these analysis by using these data set will show how it is the important for our country to file a patent application in the nuclear field and will help us to compare the domestic results to the worldwide.