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Atomic scale characterization of SİAlON based materials through transmission electron microscopy (TEM) techniques

2012
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Advisor: Prof. Dr. Servet Turan

Abstract (EN)

The goal of this thesis is to characterize the SiAlON based materials at atomic scale through a variety of transmission electron microscopy (TEM) techniques. For the first time in the literature, the results demonstrate that: (i) Yb and Ce atoms are preferentially incorporated into the ß-SiAlON crystal structure at the atom-specific interstitial lattice locations, yielding higher solubility for Yb than Ce; (ii) More expressly, Yb atoms take place in between two hexagonal rings, whereas Ce atoms mostly exist in the middle of hexagons; (iii) This observation is also confirmed in the Yb-Ce co-doped system; (iv) Ce atoms without any co-doped cation are present in the triangular-like host sites of ?-SiAlON unit-cell, accommodating much more atoms than interstitial hexagons in ß-SiAlON; (v) Yb and Ce atoms are periodically and differently arranged in the structure of intergranular films (IGFs) with only less than 1 nanometer thickness, explaining that they are in semi-crystalline nature, not completely amorphous;(vi) Yb and Ce atoms also constitute a clustered atomic transition-zone between the crystalline/amorphous interfaces, i.e., ?-ß SiAlONs/triple junctions; (vii) the Fe, Cr and Ti atoms enter in the ß-SiAlON crystal structure, leading a substitution mechanism in basic (Si,Al)(O,N)4 tetrahedrons, and (viii) the determination of highly luminescent character in Yb and Ce doped ß-SiAlON lattices strongly suggests the synthesis of ß-SiAlON:Yb+2 and ß:SiAlON:Ce+3 phosphors. Shortly, advanced TEM findings presented herein clearly show the visualization and identification of individual rare-earth and transition metal atoms in ?- and ß-SiAlON lattices, IGFs and interfaces. This capability offers new atomic-level engineering insights into how appropriate doping atoms and host SiAlON polymorphs should be chosen for tailoring of both next-generation SiAlON based structural and optical materials. It is also anticipated that the obtained results in this thesis will be applicable as guidelines for many kinds of rare-earth and transition metal atom doped materials using in different applications.

Author

Dr. Hilmi Yurdakul

How to Cite

Hilmi Yurdakul (Doctorate thesis). Atomic scale characterization of SİAlON based materials through transmission electron microscopy (TEM) techniques, 2012, Anadolu University.

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