Kadmiyum çinko telleryum radyasyon dedektörlerinde kullanılan kadmiyum çinko telleryum ince filmlerin yapısal ve optik karakterizasyonu

The microstructural and morphological characterizations of Cadmium Zinc Tellur (CZT) thin films were studied in details. The CZT thin films were deposited on glass substrates at 200, 300 and 400 °C by radio frequency magnetron sputtering technique and annealed at 200, 300 and 450 °C for an hour under N2 and mixed N2H2 ambient at atmospheric pressure. X-ray Diffraction (XRD), Energy Dispersive Spectroscopy (EDS), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS), and UV transmission spectroscopy measurements were performed. The XRD measurements emphasized that the annealed CZT films have a cubic-oriented (111), (220) and (311) polycrystalline structure, whereas as deposited films are mostly-amorphous. The effects of sputtering and annealing temperatures on the composition of the thin films were also discussed. EDS analysis was used to study the chemical composition of source and CZT thin films. SEM was used for surface morphology. It was concluded that post-annealing and deposition temperatures have explicitly effects on variation of the CZT thin film structure and morphology. AFM was used to study roughness of the CZT thin films which deposited under various sputtering and annealing temperatures. Then XPS measurements were performed in the depth profiling mode to comprehend the chemical composition of the films. Finally, transmission measurements were performed to find out band gaps of the samples. The optimum conditions were revealed for CZT deposition in accordance with their applications.