Investigation of electrical properties of silicon pin diodes

In this thesis, the electrical characterization of the silicon-based BPW41N (PIN) photodiode was performed and its electrical parameters were determined and information about the dominant current conduction mechanism was tried to be obtained through these parameters. From the current-voltage (I-V) measurements between 80-300K temperatures, it was observed that there was a deviation due to the series resistance effect with the applied voltage value of our PIN photo diode. The electrical parameters were determined according to the dominant current conduction mechanism. In addition, the series resistance of our device was tried to be determined by using Norde and Cheung methods. At room temperature, the series resistance and barrier height were calculated as 147 Ω and 0.881 eV with the Norde function, and the series resistance was calculated as 2.77 and 2.076 Ω, the barrier height was 2.083 Ω, and 0.654 eV with the Cheung method. These differences have been interpreted depending on the current-conduction mechanism and methods.