Tarama sonda mikroskobu ile nanometre düzeyinde elektriksel karakterizasyon

In this work, we propose methods for electrical characterization of nanostructuredsurfaces using electrostatic force and tunneling current measurements inscanning probe microscopy. Resolution smaller than 10 nm in electrostatic forcemicroscopy (EFM) is attained and reasons for this attainment is explained interms of the tip-sample capacitance and mechanical vibrations of tip design. Dynamicmeasurements are done in EFM using a lumped model for tip-sampleelectrostatic interaction instead of a simple tip-sample capacitance model. Surfacephotovoltage measurements are done and assured in EFM using frequencyresponse techniques. Also, combining tunneling current measurements by EFMmeasurements, optoelectonic properties of graphene/graphene oxide samples arecharacterized.