Investigation of the structural, electrical conductivity and radiation shielding properties of Co-conjuge nn liganted Co-ZnO films

In this thesis study, cobalt (CoO), C20H13N3Cl2Co and C16H11N3Cl2Co doped (0, 0.02, 0.04 and 0.06) zinc oxide (ZnO) thin films were produced by Sol-Gel spin coating technique. The thin films produced were annealed at 500 °C for 1 hour. The structural and optical properties of the produced films were determined using SEM, XRD, UV-Vis and FT-IR spectroscopy. In addition, the electrical conductivity and radiation shielding properties of cobalt and conjugated cobalt-doped films of ZNO have been investigated. The radiation shielding parameters of the thin films (MAC, LAC, MFP, HVL and Zet) were determined by gamma spectrometry with ULEGe detector in the energy December of 186.1-1764.5 keV. The XRD results revealed that all ZnO films produced have a hexagonal wurtzite crystal structure and there is no secondary crystal phase due to cobalt and conjugated Co contribution. An increase in the crystal plane has been observed due to the increased Co ratio (110). It has been determined that stable structures are formed on the surface images of all films produced. UV-Vis Decrees have shown that the band gaps of the films range between 2.79 and 3.13 eV and the refractive index is around 2.39 eV. The electrical conductivity of the ZnO thin film was obtained as 1.5 10-7 (S/cm). As the amount of cobalt additive increased from 0% to 6%, the conductivity decreased from 1.5 ± 10-7 to 2.26 ± 10-10 (S/cm).