Frequency-selective permittivity determination of solid dielectric materials backed by a conductor

We have presented a method for complex permittivity detection with short-circuit termination of low-loss materials based solely on amplitude reflectance measurements. This method has advantages and disadvantages. The first advantage is that we can obtain max and min frequencies and make derivation easier because a certain frequency is observed. The second advantage is that it does not require calculation. The disadvantage of this method is that it requires us to use a wide bandwidth and is more suitable for materials with a high dielectric constant. In this method, which we use the Reflection Method, complex and only amplitude scatter parameter measurements of a low loss material (silicon) placed in the section of a waveguide are calculated and supported by numerical analysis. Like other non-resonance methods, the method may be a coarse indicator of the imaginary portion of permeability for low loss samples.