Ellipsometric study of optical properties of Cu2S thin films prepared by vacuum evaporation technique

In this study, optical properties of Cu, Cu2S/Cu and Cu2S films prepared by vacuum evaporation have been investigated by ellipsometric and spectrophotometric methods. Moreover, the structural data of Cu2S thin films were obtained by X-ray diffractometer. The photon energy dependence of optical properties of Cu and Cu2S/Cu systems in the visible range has been determined by ellipsometric method. The principle angle of opaque Cu film has been obtained to be in the value of 66.8 ? degrees from the variation of the ellipsometric angles and with the angle of incidence. The forbidden band gaps of Cu2S thin films deposited on the glass substrates for different temperatures have been determined by the optical absorption measurements. It has been stated that the values of the forbidden band gaps determined the Cu2S thin films are in the energy range of 2.48-2.52 eV and convenient with the results reported in the literature (Bagul, Chavhan, Sharma, 2007; Zhuge, Li, Gao, Gan, Zhou, 2009). The diffraction patterns of deposited films determined by X-ray diffractometer have represented to be Cu2S of the phase grown.Key Words:Ellipsometry, thin films, optical properties