Doğru akım püskürtme yöntemi ile üretilmiş Bi(Pb)SrCaCuO ince filmlerin bazı fiziksel ve manyetik özellikleri

In this thesis, the most suitable annealing condition for the Bi(Pb)SrCaCuO (Bi-2212) thin films produced by standard direct current (DC) magnetron reactive sputtering method at 100 watt on the magnesium oxide (MgO) single crystal substrate was investigated. Moreover, some physical and magnetic properties of the thin films annealed at 840 C and 850 C for different annealing times (1h, 2h, 4h, 6h and 8h) were examined. DC sputter device, cryostat system, X-ray diffractometer (XRD), scanning electron microscopy (SEM) and energy dispersive spectrum analysis were used to obtain the experimental results. At first, target of the thin film samples produced in this work was prepared by means of solid state reaction method. Ten Bi(Pb)SrCaCuO (Bi-2212) thin films were produced on the magnesium oxide at DC sputter device. The effect of different annealing times on the superconducting critical temperature (Tc) of Bi(Pb)SrCaCuO thin films was investigated by the resistivity measurements. These measurements were performed by helium gas contact cryostat in the temperature range from 30 to 120 K with DC current of 1 mA. Moreover, resistivity dependence of temperature measurements for only the film annealed at 8400C for 2 hours were carried out under field strengths of 0, 0.5, 1, 3 and 5 T, which were parallel and perpendicular to the film surface. X-ray diffraction graphs were obtained and the peaks on these graphs were determined by the help of the literature. Volume fractions of Bi-2223 and Bi-2212 and lattices parameters of the all films were also calculated. After that, the images of scanning electron microscopy were obtained to analyze the surface morphology. Finally, the results of energy dispersive spectrum analysis of the Bi(Pb)SrCaCuO thin films were also taken and the weight percent of elements of these films were theoretically calculated.