Kuars kristali kullanılarak AKM geri beslemeli taramalı hall aygıtı mikroskopisi

canning Hall Probe Microscopy (SHPM) is a quantitative and non-invasivetechnique for imaging localized surface magnetic field fluctuations such asferromagnetic domains with high spatial and magnetic field resolution ofabout50nm and 7mG/SQRT(Hz) at room temperature. In the SHPM technique,Scanning Tunneling Microscope (STM) or Atomic Force Microscope (AFM)feedback is usually used for bringing the Hall sensor into close proximity of thesample. In the latter, the Hall probe has to be integrated with an AFM cantileverin a complicated microfabrication process. In this work, we have eliminated thedifficult cantilever-Hall probe integration process; a Hall sensor is simply glued atthe end of Quartz crystals, which are used as a force sensor. The sensor assemblyis dithered at the resonance frequency and the quartz force sensor output isdetected with a Lock-in and PLL system. SHPM electronics is modified to detectAFM topography and the phase, along with the magnetic field image. NIST MIRS(Magnetic Referance Sample) (Hard Disk) sample, 100 MB high capacity zip diskand Garnet sample are imaged with the Quartz Crystal AFM feedback and theperformance is found to be comparable with the SHPM using STM feedback.Quartz Crystal AFM feedback offers a very simple sensor fabrication andoperation in SHPM. This method eliminates the necessity of conducting samplesfor SHPM.Keywords: Scanning Tunneling microscopy, Atomic Force Microscopy, ScanningHall Probe Microscopy, Non-contact mode AFM, Quartz tuning forks.