Piezo etkileşimli çift katmanlı atomik kuvvet mikroskobu probunun dinamiğini değiştirmek için durum geri besleme kontolü

In this thesis, we adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and/or the resonance frequency of the probe simultaneously. We first investigate the effect of feedback gains on the dynamic response of probe and then show that the time constant of the probe can be reduced by reducing its quality factor and/or increasing its resonance frequency to improve the scan error in tapping mode AFM.