The examination of the pure aluminium and zinc doped samples with X-ray diffraction method

In this work, by using X-ray difraction method, Al pured 99,99 % and thedoping effect of Zn in rates of 100ppm, 500ppm, 1000ppm, 2000ppm, 3000ppmon Al were investigated. Themal process with one hour duration at 6000C wasapplied to the samples. X-ray difraction patterns of samples both in the formincase of plate and powder were taken. From these X-ray difraction patternsusing peak intensities, we determined that dopping the Al samples with Zn inrising rates decreased the oxidation rates for both thermally processed andunprocessed cases. After cleaning the oxide layer of the Al plate by surfaceprocess we examined pure Al plate using X-ray difraction method, we foundthat the intensities of Al peaks increased. For samples with thermal processapplied and without thermal process were taken surface pictures with metalmicroskope and it was determined that thermal process caused new defects onthe surface of samples. To determine the temperature effects on crystalstructure of Al samples, the lattice parameter was measured using X-raydifraction patterns. It was seen that the lattice parameter a shows a linearincrease depending on the temperature.Key Words : X-ray Difraction, Aluminum, ppm, Zinc, thermal process