Software development for the analyses of x-ray diffraction data

SOFTWARE DEVELOPMENT FOR THE ANALYSES OF X-RAY DIFFRACTION DATA (M.Sc. Thesis) Yusuf ÖZÇATALBAŞ GAZI UNIVERSITY INSTITUTE OF SCIENCE AND TECHNOLOGY September 1988 ABSTRACT Most of the X-Ray Diffraction systems used in Turkey don't have a computer system. For this reason, the processing of the data is more difficult and takes more time. To overcome this problem, use of a GU-BASIC computer program was planned to determine the structure and tha parameters of materials. In the first stage 180 JCPDS diffraction data cards had been loaded in a random access file to the computer. In the program the position and intensity of the peaks obtained by XRD are loaded to the computer and thus the lattice parameters and structures of the specimens are obtained. Then using the Hanawalt method, suitable cards are chosen. The possible personnel errors vere considered and some necessary precautions were taken to prevent them. The diffraction data card of the specimen appears in its original format on the screen and can be printed in the same format. Ill