The calculation of the Auger electron emission rates, Kα, KLLline widths and L sub-shell level widths of elements within the range of atomic numbers 21≤z≤30

The produced alloys and compounds by using 3d transition elements have many applications such as automotive industry, opto-electronic applications and bio-sensors. The electronic structure of these elements should be examined in order to have information about the changes in the structure of materials which offer a wide range of products in the developments of science and technology. The reason of this study is that the valence shell electronic structure is the most effective factor which constitute the chemical bonds. The measurement of K shell fluorescence parameters has an important position in the examination of the outer shell electronic structure of 3d transition elements. Any change in the electronic structure, as in the chemical binding effects occured in M shell of the 3d transition elements will affect the L sub-shells and consequently, the X-ray transitions from L to K shell. Thus, it can be get indirect information about the electronic structure of atoms by using the changes in X-ray transitions. In this thesis, the Auger electron emission rates, Kα and KLL X-ray line widths and L sub-shell elevel widths were determined by using energy dispersive X-ray fluorescence method. First, the elements were irradiated by annular 241Am radioactive source which emittedray photons at 59,5 keV and the emitted X-rays were counted by Ultra-LEGe detector had a resolution 150 ev at 5,9 keV. The areas under the detected photo-peaks were used for the measurement of X-ray fluorescence parameters. The obtained results were compared with previous studies in the literature. Also, the measured parameters are important for the development of new theories to understand the complex structure of M shell and the designing and production of new devices for material characterisation such as XRD and XRF.