Measurements of K- shell x-ray cross-section and fluorescence yields using secondary source for some elements in the atomic number range 22≤Z≤35

In this study, γ-beams of 59.5 keV radiating from an Am-241 radioisotope point source were used to excite secondary source. K X-ray fluorescence cross sections of, Kα, Kβ, of 23V,24Cr, 26Fe, 27Co,28Ni 31Ga ve 33As elements whose atom numbers in the range of 22 ≤ Z ≤ 35 were measured by using characteristic X-ray is emitted from secondary sources were in an energy 11.372keV. A Si(Li) solid-state detector with 160 keV resolution at 5.9 keV was used to count K X-rays radiating from K layers as a result of excitation of samples. Fluorescence yields of K shells of the elements were determined by semi-empirical methods with the help of fluorescence cross sections. The benefits of using secondary sources were observed. Obtained values were compared with similar studies in the literature.