Investigation of structural, optical and morfological properties of CuS semiconductor thin films prepared by chemical bath deposition

In this thesis, semiconductor CuS thin films were deposited by chemical bath deposition method at 27 °C, 50 °C, 70 °C on glass substrate through 0.1 M, 0.3 M and 0.5 M were obtained thin films. Investigation of the structural, optical and morpholgical properties of the CuS thin films. The XRD analyses indicate that CuS thin films exhibit amorphous and polycrystal structure and hexagonal phase. In order to determine the optical properties of the semiconductor CuS thin films UV/vis spectrophotometer (190-1100 nm) was used. Optical parameters such as energy bant gap (Eg), reflection (R) and refractive index (n) values are acquired using aforementioned basic parameters. Field Emission-Scanning Electron Microscope (FE-SEM) images show that the films have a homogeneous distribution in the spherical structure, and the effect of temperature is seen to be more strict.