Determi̇nati̇on of optical parameters for semiconductor thin films with kramers-kronig relations

The Kramers-Kronig transformations are numerical methods, that are useable to obtain refractive index and extinction coefficient from reflection spectra. The Kramers-Kronig transformations were adapted to Mat-Lab Software and determined the optical parameters of semiconductor thin films. The optical parameters of semiconducting thin films, which were produced in this study, were calculated from reflection spectra with K-K transformations. The calculated theoretical results were in good agreement with experimental data.