Use of seed vigour tests to predict field radicle emergence and storage longevity in sweet corn (Zea mays convar. saccarata L.) seeds

This work was carried out to predict field emerge and germination after storage (12 months, 9-10 % seed moisture, 20  2 C temperature) through seed vigour tests (standard germination, radicle emerge, cold test, accelerated aging test and electrical conductivity) in eight sweet seed lots. RE test was performed by root emergence of 2 mm between 32-79 hours, cold test was performed by total and normal germination after 2 days at 5 C and 4 days at 25 C, HYT was performed by keeping at 41 C for 72 hours at 100% relative humidity, and EC test was performed by keeping 20 seeds in 40 ml distilled water for 4 and 8 hours. Seed vigour tests were found to be statistically significantly associated with field emergence rate and germination after storage at different levels. The seed vigour tests that showed the highest level of significance with both field emergence rate and storage germination were cold test and accerelate aging tests. According to the results of the thesis, CTN (r=0.945, P0.001), CT+RE79 (r=0.920, P0.01) and AA+RE72 test (r=0.844, P0.01) stand out as the most successful tests in predicting field emergence and storage germination in sweet corn. Although the RE72, RE79 and standard germination tests were successful in predicting field emergence rate, no significant relationship was found in any of the samples for germination after storage. The EC test was found to be relatively less successful than the other tests, with few significant results. Repeating the study with eight seed lots with a higher number of seed lots will expand the extensive use of the tests in the sweet corn.