Tek olay etkisinin iyon demetleri ve lazer ile test edilmesi

Single Event Effect (SEE) is a process which is generated by heavy ions and protons. While heavy ions and protons pass through semiconductor based electronic devices like CMOS (Complementary Metal Oxide Semiconductor), optoelectronic or bipolar electronic devices, depending on their energy and type, may create parasitic transistors causing soft (not distructive) or hard (potentially distructive) errors. For this reason, these devices have to be tested on Earth for their susceptibility to radiation effects. The extended to which the devices are to be tested depends on several factors as mission duration, location and device's use. The test standarts are provided by space agencies such as NASA and ESA in which the test procedures are described in detail. To analyse the radiation environment for a given set of mission parameters, SPENVIS, CREME96 and OMERE are the most commonly used information systems or tools. The qualification test aganist SEE is performed at heavy ion and proton accelerators as LNS (Laboratori Nazionali del Sud'). An infirared pulsed laser system developed in MAPRAD laboratories is a useful tool for qualitative measurements. Several devices were tested first at IR laser beam setup and then were taken to LNS laboratories for testing with heavy ions.In this work, we investigated the setups, which are used for laser beam test and ion beam test, in detail and their simulations were developed with different simulation programs before the devices were tested by ion beams. Used simulation programs GEANT4 and FLUKA for these simulations, some parameters were calculated such as LET (Linear Energy Transfer), deposited energy and track length etc. The results of the simulations were compared and discussed.