A study of copper thin films by X-ray absorption spectroscopy

ABSTRACTMSc THESISEla TAZEDEPARTMENT OF PHYSICSINSTITUTE OF NATURAL AND APPLIED SCIENCESUNIVERSITY OF CUKUROVASupervisor: Prof.Dr. Yüksel UFUKTEPEYear: 2005, Pages: 65Jurry: Prof.Dr. Yüksel UFUKTEPEAssoc.Prof.Dr. Metin ÖZDEMİRAsist.Prof.Dr. Zerrin ESMERLİGİLAbsorption spectroscopy with soft X-rays (XAS) has been developed into a standart tool in surface science and solidstate physics. Extended x-ray absorption fine structure spectroscopy (EXAFS) is a powerful tool for investigating localatomic order and orientation. Usually the absorption coefficient is determined by a transmission experiment using a sampleof known thickness. L-edge absorption fine structure (XAFS) studies of transition metals have become of great interest,since they allow acces to the important d valence electrons through p-d dipole transitions.In this study results are presented for EXAFS of copper for the photon energy range between 900 eV and 1100 eV.In the x-ray absorption spectra of Cu metal at L2,3 edge shows two sharp peaks. The peaks are attributed to the twospin-orbit compenents from the 2p 3/2 and 2p 1/2 transitions. The L2 and L3 spectra are very similar in shape with their relativemagnitude close to 1:2.Keywords: X-rays absorption spektroscopy (XAS), EXAFS, Copper L2,3 edges, thin film, transition metals