A study of cobalt thin films by X-ray absorption spectroscopy
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Abstract (EN)
A characterization of 3d metal thin films is essential to understand their microscopic origins. We have used high resolution L-edge x-ray absorption spectroscopy (XAS), which is element specific and sensitive to chemical environment, to investigate the thin films of 3d metals. We have studied thin Cobalt films by soft x-ray absorption spectroscopy to determine the total electron yield sampling depth (?e) in Co at the Co L2,3 edge. We have determined ?e (escaping depth). This value was compared with studies in the past and thus the results in this study are suitable.Our analysis yields a value of ?e =2.7±0.1 nm for the TEY sampling depth.
Author
Ayşe Bozduman
How to Cite
Ayşe Bozduman (Master Thesis). A study of cobalt thin films by X-ray absorption spectroscopy, 2008, Çukurova University, Fizik Bölümü.
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