Determi̇nati̇on of optical parameters for semiconductor thin films with kramers-kronig relations
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Abstract (EN)
The Kramers-Kronig transformations are numerical methods, that are useable to obtain refractive index and extinction coefficient from reflection spectra. The Kramers-Kronig transformations were adapted to Mat-Lab Software and determined the optical parameters of semiconductor thin films. The optical parameters of semiconducting thin films, which were produced in this study, were calculated from reflection spectra with K-K transformations. The calculated theoretical results were in good agreement with experimental data.
Author
Gizem Çetin Karakaya
How to Cite
Gizem Çetin Karakaya (Master Thesis). Determi̇nati̇on of optical parameters for semiconductor thin films with kramers-kronig relations, 2014, Çukurova University.
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