Design and implementation of a novel microcontroller based test system for thermoelectric modules

In this study, a universal microcontroller test system, which is aimed to determine the dynamic parameters of widely used thermoelectric modules in a simple, efficient and reliable manner, has been designed and realized. For the purpose of this work, the test system has been designed according to a more simplified form of the present formula set which has been made to accept minimum variables as input to obtain more precise results. As a result, a test system, which can measure the dynamic parameters of a thermoelectric module universally by measuring only the hot side temperature, module operation voltage, module current and thermoemf values of the module, has been obtained. Then, the realized new test system has been used to measure some standard thermoelectric module and systems. According to the results of these tests, the efficiency and reliability of the proposed new method has been proven.