Effect of NaOH molar concentration on the physical properties of Cu2O thin films

In this study, Cu2O thin films were prepared by Succesive Ionic Layer Adsorption and Reaction (SILAR) method at different molar concentrations of NaOH (1 M, 2 M and 4 M) and on different substrates (glass and ITO) at 60 °C deposition temperature for 30 immersion cycles. The properties (structural, morphological and optical) of Cu2O thin films were investigated as a function of NaOH molar concentration and substrates. From the X-ray diffraction analysis of Cu2O thin films, it was determined that the crystallization of the films was dependent on the NaOH molar concentration and the substrates. All films obtained showed a preferential orientation along the (111) plane and were polycrystalline in the cubic phase. It was observed that the thickness values of the films increased with increasing NaOH concentration and the transmittance (%T) values at room temperature decreased accordingly. NaOH concentration and substrates were found to provide significant changes in the FE-SEM images and optical properties of Cu2O thin films at room temperature.