Design and implementation of chaos sourced and ADC based novel true random number generators

The studies in this thesis consists of three main stages. At the first stage, a microcontroller and computer controlled chaotic circuit testing set (CCTS) for fast modelling of continuous-time chaotic systems (CTCS) has been designed and implemented. At the second stage, a microcontroller and computer controlled platform (MCCP) has been designed and implemented to design ADC based true random number generator (TRNG) fast and easily. At the last stage, new TRNGs pass the all of NIST-800-22 statistical tests, which is the highest international standards have been designed and implemented by using CCTS and MCCP for design of TRNG. At the first stage of the thesis, firstly reference chaotic systems used as entropy source of TRNG have been analyzed. Secondly, reference chaotic systems have been modeled by using analog circuit component and the phase portraits of chaotic electronic circuits modeled have been simulated in OrCAD-PSpice. Thirdly, a CCTS has been designed and implemented to make complex and extremely time-consuming process of chaotic circuit implementation fast and easily. After that, reference chaotic systems has been realized using CCTS and then oscilloscope outputs of real circuits have been compared with Mat lab, OrCAD-PSpice outputs. At the second stage, a MCCP has been designed and implemented to be used on design of ADC based TRNG fast and easily. The unique aspects of this system come from using chaotic system also different entropy sources such as radio frequency (RF), temperature as an entropy source, using different entropy sources by mixing each other, selecting different last processing algorithm. At the last stage, Rucklidge, Chen and Zhongtang chaotic systems based TRNGs have been designed and implemented using CCTS and MCCP. TRNGs realized has been subjected to NIST-800-22 statistical tests. Chen and Zhongtang chaotic system based TRNGs have passed successfully to NIST statistical tests. Keywords: True Random Number Generator, Statistical Randomness Tests, NIST Statistical Tests, Chaos, Continuous-time Chaotic Systems, Microcontroller