Production and characterization of cus thin films with chemical bath deposition method

In this thesis, copper sulfide (CuS, covellite) thin films were prepared by chemical bath deposition method on glass substrates using different copper salt sources at 27 °C (96 hours) and 50 °C (7 hours). The physical properties (structural, optical, morphological and electrical) of copper sulfide thin films were examined in detail. It was determined from the X-ray diffraction (XRD) analysis that the films were formed in the hexagonal phase in the polycrystalline structure. Optical transmittance and absorption values of the films at room temperature were examined in the range of 400–1100 nm. Then, using these values, energy band gap Eg, reflection R, extinction coefficient k, refractive index n, real and imaginary dielectric constant ε1, ε2 values were calculated. From Hall measurements, CuS thin films showed p-type conductivity and resistivity values were found.