Sol-gel yöntemiyle üretilen zno tabanlı seyreltik manyetik yarıiletken ince filmlerin ve nano parçacıkların karakterizasyonu

In recent years, ZnO-based diluted magnetic semiconductor materials are a field of great interest because of their using in technological applications. Applications of the produced ZnO-based nano-particle and nano thin film are the thermal glass, piezoelectric devices, solar cells, solid-state gas sensors, surface acoustic wave devices, laser devices, microelectromechanical systems (MEMS), organic light-emitting diodes and spintronic (reader head in magnetic hard disks and giant magnetoresistance (GMR)). Spintronic is replacing by semiconductor technology-based memory production. For this reason, researches are increasing gradually both the fundamental scientific and technological. Therefore, in this thesis, transition metal and rare earth element doped nano thin films and bulk samples of diluted magnetic semiconductors (DMSs) which have dual structure of (Zn1-xBx)O (B=Co, Er) and ternary structure of (Zn1-xBxCO) (C=Cu, Cd) are prepared by using sol-gel method. The microstructure, electrical, optic, magnetic and micromechanic properties of prepared nano thin films and nano bulk materials are investigated. Firstly, the materials which have the greatest doping rate to determination of optimum annealing temperature of nano bulk materials are subjected to last heat treatment at 400oC, 450oC, 500oC, 550oC and 600oC for 30 min after first heat treatment. After this process, all of doped nano thin film and nano bulk materials are annealed under determined annealing temperature. The systems, (Zn1-xBx)O dual and (Zn1-xBxCO) ternary structures, are prepared as polycrystalline nanoparticle powders by applying the sol-gel method. Nano thin films are coated on the glass substrate by using the dip coating method. The X-ray diffractometer (XRD), scanning electron microscopy (SEM), energy dispersive spectrometer (EDS) and atomic force microscopy (AFM) are used to determination of structural properties such as crystal structures, grain sizes, percent of elements, surface morphology; hall effect measurements system is used to determination of electrical properties of materials; UV-VIS spectrophotometer is used to determination of optic properties; vibrating sample magnetometer (VSM) system is used to determination of magnetic properties and Vickers microhardness device is used to determination of micromechanic properties of produced nano thin film and nano bulk materials. KEYWORDS: Diluted Magnetic Semiconductor (DMS), Sol-Gel Method, ZnO, Nano thin film, Nanoparticle